JPH043370U - - Google Patents

Info

Publication number
JPH043370U
JPH043370U JP4229690U JP4229690U JPH043370U JP H043370 U JPH043370 U JP H043370U JP 4229690 U JP4229690 U JP 4229690U JP 4229690 U JP4229690 U JP 4229690U JP H043370 U JPH043370 U JP H043370U
Authority
JP
Japan
Prior art keywords
under test
insulating substrate
position corresponding
terminal
output terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4229690U
Other languages
English (en)
Japanese (ja)
Other versions
JP2517456Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4229690U priority Critical patent/JP2517456Y2/ja
Publication of JPH043370U publication Critical patent/JPH043370U/ja
Application granted granted Critical
Publication of JP2517456Y2 publication Critical patent/JP2517456Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP4229690U 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具 Expired - Fee Related JP2517456Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4229690U JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4229690U JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Publications (2)

Publication Number Publication Date
JPH043370U true JPH043370U (en]) 1992-01-13
JP2517456Y2 JP2517456Y2 (ja) 1996-11-20

Family

ID=31553718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4229690U Expired - Fee Related JP2517456Y2 (ja) 1990-04-20 1990-04-20 アナログｉｃテスタの校正用治具

Country Status (1)

Country Link
JP (1) JP2517456Y2 (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1990644A3 (en) * 2003-09-09 2009-09-30 Advantest Corporation Calibration apparatus, testing apparatus, and calibration method

Also Published As

Publication number Publication date
JP2517456Y2 (ja) 1996-11-20

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees